Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

• Marius van den Berg,
• Ardeshir Moeinian,
• Arne Kobald,
• Yu-Ting Chen,
• Anke Horneber,
• Steffen Strehle,
• Alfred J. Meixner and
• Dai Zhang

Beilstein J. Nanotechnol. 2020, 11, 1147–1156, doi:10.3762/bjnano.11.99

• of the Raman peaks of crystalline Si and amorphous Si by applying tip-enhanced Raman spectroscopy, at sample positions being 8 nm apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agrees well with the high-resolution transmission electron

• local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques. Keywords: core–shell nanowires; local crystallinity; polarization angle-resolved spectroscopy; silicon; tip-enhanced Raman spectroscopy; Introduction The properties of silicon are long

• the optical and electronic behavior of nanowire building blocks. Hence, there is an inherent need for non-destructive characterization techniques that are able to elucidate the local crystallinity. Raman spectroscopy is such a type of non-destructive characterization techniques and has become a